Photoelectron spectromicroscopy of electrochemically induced oxygen spillover at the Pt/YSZ interface

B. Luerßen, S. Günther, H. Marbach, M. Kiskinova, J. Janek, R. Imbihl

Research output: Contribution to journalArticlepeer-review

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Abstract

Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 Å thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an O 1s binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase.

Original languageEnglish
Pages (from-to)331-335
Number of pages5
JournalChemical Physics Letters
Volume316
Issue number5-6
DOIs
StatePublished - 21 Jan 2000
Externally publishedYes

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