Phenomenological modeling of passive intermodulation (PIM) due to electron tunneling at metallic contacts

Johannes Russer; Aravind Ramachandran; Andreas Cangellaris; Peter Russer

doi:10.1109/MWSYM.2006.249389

Phenomenological modeling of passive intermodulation (PIM) due to electron tunneling at metallic contacts

Johannes Russer, Aravind Ramachandran, Andreas Cangellaris, Peter Russer

Technical University of Munich

University of Illinois at Urbana-Champaign

Research output: Contribution to journal › Conference article › peer-review

22 Scopus citations

Abstract

A methodology is proposed tor the phenomenological modeling of passive intermodulation (PIM) generation due to electron tunneling in metallic contacts in the signal transmission path of an RF/microwave system. The proposed model aims at enhancing the understanding of this type of PIM source through the investigation of the impact of surface roughness and skin effect on the levels and frequency dependence of PIM interference. Furthermore, the proposed methodology is such that it provides for the development of PIM source models for metallic contacts that are compatible with general-purpose electromagnetic and network analysis-oriented, non-linear circuit simulators.

Original language	English
Article number	4015119
Pages (from-to)	1129-1132
Number of pages	4
Journal	IEEE MTT-S International Microwave Symposium Digest
DOIs	https://doi.org/10.1109/MWSYM.2006.249389
State	Published - 2006
Event	2006 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA, United States Duration: 11 Jun 2006 → 16 Jun 2006

Keywords

Electron tunneling
Non-linear circuit simulation
Passive intermodulation
Transient electromagnetic field solvers

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10.1109/MWSYM.2006.249389

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title = "Phenomenological modeling of passive intermodulation (PIM) due to electron tunneling at metallic contacts",

abstract = "A methodology is proposed tor the phenomenological modeling of passive intermodulation (PIM) generation due to electron tunneling in metallic contacts in the signal transmission path of an RF/microwave system. The proposed model aims at enhancing the understanding of this type of PIM source through the investigation of the impact of surface roughness and skin effect on the levels and frequency dependence of PIM interference. Furthermore, the proposed methodology is such that it provides for the development of PIM source models for metallic contacts that are compatible with general-purpose electromagnetic and network analysis-oriented, non-linear circuit simulators.",

keywords = "Electron tunneling, Non-linear circuit simulation, Passive intermodulation, Transient electromagnetic field solvers",

author = "Johannes Russer and Aravind Ramachandran and Andreas Cangellaris and Peter Russer",

year = "2006",

doi = "10.1109/MWSYM.2006.249389",

language = "English",

pages = "1129--1132",

journal = "IEEE MTT-S International Microwave Symposium Digest",

issn = "0149-645X",

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note = "2006 IEEE MTT-S International Microwave Symposium Digest ; Conference date: 11-06-2006 Through 16-06-2006",

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TY - JOUR

T1 - Phenomenological modeling of passive intermodulation (PIM) due to electron tunneling at metallic contacts

AU - Russer, Johannes

AU - Ramachandran, Aravind

AU - Cangellaris, Andreas

AU - Russer, Peter

PY - 2006

Y1 - 2006

N2 - A methodology is proposed tor the phenomenological modeling of passive intermodulation (PIM) generation due to electron tunneling in metallic contacts in the signal transmission path of an RF/microwave system. The proposed model aims at enhancing the understanding of this type of PIM source through the investigation of the impact of surface roughness and skin effect on the levels and frequency dependence of PIM interference. Furthermore, the proposed methodology is such that it provides for the development of PIM source models for metallic contacts that are compatible with general-purpose electromagnetic and network analysis-oriented, non-linear circuit simulators.

AB - A methodology is proposed tor the phenomenological modeling of passive intermodulation (PIM) generation due to electron tunneling in metallic contacts in the signal transmission path of an RF/microwave system. The proposed model aims at enhancing the understanding of this type of PIM source through the investigation of the impact of surface roughness and skin effect on the levels and frequency dependence of PIM interference. Furthermore, the proposed methodology is such that it provides for the development of PIM source models for metallic contacts that are compatible with general-purpose electromagnetic and network analysis-oriented, non-linear circuit simulators.

KW - Electron tunneling

KW - Non-linear circuit simulation

KW - Passive intermodulation

KW - Transient electromagnetic field solvers

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U2 - 10.1109/MWSYM.2006.249389

DO - 10.1109/MWSYM.2006.249389

M3 - Conference article

AN - SCOPUS:34250304767

SN - 0149-645X

SP - 1129

EP - 1132

JO - IEEE MTT-S International Microwave Symposium Digest

JF - IEEE MTT-S International Microwave Symposium Digest

M1 - 4015119

T2 - 2006 IEEE MTT-S International Microwave Symposium Digest

Y2 - 11 June 2006 through 16 June 2006

ER -

Phenomenological modeling of passive intermodulation (PIM) due to electron tunneling at metallic contacts

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Keywords

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