Abstract
Interferometric methods are well established in optics and radio astronomy. In recent years, interferometric concepts have been applied successfully to synthetic aperture radar (SAR) and have opened up new possibilities in the area of earth remote sensing. However interferometric SAR applications require thorough phase control through the imaging process. The phase accuracy of SAR images is affected by decorrelation effects between the individual surveys. We analyze quantitatively the influence of decorrelation on the phase statistics of SAR interferograms. In particular, phase aberrations as they occur in typical SAR processors are studied in detail. The dependence of the resulting phase bias and variance on processor parameters is presented in several diagrams.
Original language | English |
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Pages (from-to) | 4361-4368 |
Number of pages | 8 |
Journal | Applied Optics |
Volume | 33 |
Issue number | 20 |
DOIs | |
State | Published - 10 Jul 1994 |
Externally published | Yes |
Keywords
- Aberrations
- Decorrelation
- Interferometry
- Phase statistics
- Synthetic aperture radar