Perspectives for regulating 10 nm particle number emissions based on novel measurement methodologies

Z. Samaras, M. Rieker, E. Papaioannou, W. F. van Dorp, M. Kousoulidou, L. Ntziachristos, J. Andersson, A. Bergmann, S. Hausberger, J. Keskinen, P. Karjalainen, S. Martikainen, A. Mamakos, Ch Haisch, A. Kontses, Z. Toumasatos, L. Landl, M. Bainschab, T. Lähde, O. PiacenzaP. Kreutziger, A. N. Bhave, K. F. Lee, J. Akroyd, M. Kraft, M. Kazemimanesh, A. M. Boies, C. Focsa, D. Duca, Y. Carpentier, C. Pirim, J. A. Noble, O. Lancry, S. Legendre, T. Tritscher, J. Spielvogel, H. G. Horn, A. Pérez, S. Paz, D. Zarvalis, A. Melas, P. Baltzopoulou, N. D. Vlachos, L. Chasapidis, D. Deloglou, E. Daskalos, A. Tsakis, A. G. Konstandopoulos, S. Zinola, S. Di Iorio, F. Catapano, B. M. Vaglieco, H. Burtscher, G. Nicol, D. Zamora, M. Maggiore

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Material Science