TY - GEN
T1 - Performance evaluation for system-on-chip architectures using trace-based transaction level simulation
AU - Wild, T.
AU - Herkersdorf, A.
AU - Ohlendorf, R.
PY - 2006
Y1 - 2006
N2 - The ever increasing complexity and heterogeneity of modern System-on-Chip (SoC) architectures make an early and systematic exploration of alternative solutions mandatory. Efficient performance evaluation methods are of highest importance for a broad search in the solution space. In this paper we present an approach that captures the SoC functionality for each architecture resource as sequences of trace primitives. These primitives are translated at simulation runtime into transactions and superposed on the system architecture. The method uses SystemC as modeling language, requires low modeling effort and yet provides accurate results within reasonable turnaround times. A concluding application example demonstrates the effectiveness of our approach.
AB - The ever increasing complexity and heterogeneity of modern System-on-Chip (SoC) architectures make an early and systematic exploration of alternative solutions mandatory. Efficient performance evaluation methods are of highest importance for a broad search in the solution space. In this paper we present an approach that captures the SoC functionality for each architecture resource as sequences of trace primitives. These primitives are translated at simulation runtime into transactions and superposed on the system architecture. The method uses SystemC as modeling language, requires low modeling effort and yet provides accurate results within reasonable turnaround times. A concluding application example demonstrates the effectiveness of our approach.
UR - http://www.scopus.com/inward/record.url?scp=34047183206&partnerID=8YFLogxK
U2 - 10.1109/date.2006.244111
DO - 10.1109/date.2006.244111
M3 - Conference contribution
AN - SCOPUS:34047183206
SN - 3981080114
SN - 9783981080117
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - Proceedings - Design, Automation and Test in Europe, DATE'06
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Design, Automation and Test in Europe, DATE'06
Y2 - 6 March 2006 through 10 March 2006
ER -