Optimization of electric field distribution by free carrier injection in silicon detectors operated at low temperatures

E. Verbitskaya, M. Abreu, V. Bartsch, W. Bell, P. Berglund, J. Bol, W. De Boer, K. Borer, S. Buontempo, L. Casagrande, S. Chapuy, V. Cindro, N. D'Ambrosio, C. Da Viá, S. R.H. Devine, B. Dezillie, A. Dierlamn, Z. Dimcovski, V. Eremin, A. EspositoV. Granata, E. Grigoriev, F. Hauler, S. Janos, L. Jungermann, I. Konorov, Z. Li, C. Lourenço, M. Mikuz, T. O. Niinikoski, V. O'Shea, S. Pagano, V. G. Palmieri, S. Paul, P. Rato Mendes, G. Ruggiero, L. Schmitt, K. Smith, P. Sousa, M. Zavrtanik

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13 Scopus citations

Abstract

We present a study of the modeling of the electric field distribution, which is controlled by injection and trapping of nonequilibrium carriers, in Si detectors irradiated by high neutron fluences. An analytical calculation of the electric field distribution in detectors irradiated by neutrons up to fluences of 1 · 1014 to 5 · 1015 cm-2 shows the possibility of reducing the full depletion voltage at low temperatures via hole injection. For this calculation, we use the detector operating parameters and equivalent neutron fluences expected for Large Hadron Collider experiments. The results of the calculation are in good qualitative agreement with published experimental data, lending strong support for the model and for an earlier proposal of electric field manipulation by free carrier injection.

Original languageEnglish
Pages (from-to)258-263
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume49
Issue number1 II
DOIs
StatePublished - Feb 2002

Keywords

  • Cryogenic detectors
  • Electric field
  • Injection
  • Radiation-induced defects
  • Silicon

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