Optimierung und Kostenreduktion im Entwicklungs- Und Produktionsprozess mechatronischer Fahrzeugkomponenten durch einen VeHiL-Teststand

Translated title of the contribution: Optimization and cost reduction in the development and production process of mechatronic vehicle components using a VeHiL test stand

J. Schenk, B. Corves, R. Müller, T. Tentrup, G. Spiegelberg

Research output: Contribution to journalArticlepeer-review

Abstract

The new and innovative VeHiL (Vehicle Hardware in the Loop) test platform for future vehicle tests represents an interface between the vehicle and its surrounding environment, the drive lane. It is applied to test all functions and functionalities of various test devices and aggregates as well as their back-up components in total interaction, within the overall vehicle. That means, this VeHiL platform, can be used to test Drive-by-Wire components and their interaction. The application of this new platform allows the location of these components in their natural environment, which is the vehicle itself. In the foreseeable future especially such software based components will become increasingly important within the framework of preventive-active and reactive-active driver assistance- and safety systems. Owing to an horizontal architecture of the different levels of responsibility in future vehicles, a test procedure, as it is applied until now, is no longer feasible- or at least it is considered by the OEM's not to be economical. Moreover, up to now the respective control devices have only been tested in their prototype phase in which they have not necessarily been linked-up with their surrounding components. However, even at this stage there has been a large share of simulative tests for Hardware in the Loop (engine behaviour, ABS, ESP, electronical vehicle environment etc.). Today, with regard to the development phase, many isolated component tests are carried out in a simulated environment (residual vehicle, environment, etc., i.e. control devices and their respective aggregates, sensors and actuators and so forth). The approach outlined above puts the OEM and the component supplier in a position of testing the functionality of components and their sub-systems, as well as the complete vehicle itself in the production-, the prototype- and also in the early development phase - this way time and costs can be reduced. Moreover, by putting this new and innovative approach into practice, it will be possible to realize a secure and efficient future test run - this will become of increasing importance due to the fact that future systems and their functionalities will be linked up at an ever increasing degree. OEMs will be able to integrate further functionalities into the horizontal drive train. For this purpose we will briefly focus on a new possible vehicle infrastructure. Further on we will take a look at the accompanying process. Before a code generation for the control devices involved in the V-process is tackled, we theoretically know from the software what kind of tests must be carried out at the VeHiL and in the completely produced prototype in order to secure a faultless and proper functionality of the partly highly safety relevant components in the total system of the vehicle. For this purpose a FMEA and a fault tree analysis will be integrated already at an early development stage. That way a kind of matrix can be automatically generated allowing a logical deduction of the tests that are necessary. By using this method it is possible to carry out vehicle tests both at the VeHiL platform and also at the test vehicle within an optimised time frame, test procedures can partly be carried out within optimised processes.

Translated title of the contributionOptimization and cost reduction in the development and production process of mechatronic vehicle components using a VeHiL test stand
Original languageGerman
Pages (from-to)809-832
Number of pages24
JournalVDI Berichte
Issue number1892 PART 2
StatePublished - 2005
Externally publishedYes

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