TY - GEN
T1 - Optimierung industrieller mikrosysteme mit hilfe maßgeschneiderter modelle
T2 - MikroSystemTechnik Kongress 2017: MEMS, Mikroelektronik, Systeme - MikroSystemTechnik Conference 2017: MEMS, Microelectronics, Systems
AU - Schrag, G.
AU - Künzig, T.
AU - Wachutka, G.
N1 - Publisher Copyright:
© VDE VERLAG GMBH ∙ Berlin ∙ Offenbach
PY - 2017
Y1 - 2017
N2 - We demonstrate that a comprehensive, physically based system-level approach based on the generalized Kirchhoffian network theory constitutes a reliable basis for the optimization of enhanced industrial MEMS devices and systems. The combination of distributed and lumped system-level models offers detailed insight in the device operation while, at the same time, keeping the computational expense low. The possibility to implement these models into standard system simulators facilitates the co-simulation with the electronic circuitry. The benefits of this modular, tailored system-level modeling approach, which combines lumped with distributed models, are exemplified by applying it to an industrial capacitive silicon microphone. This way, all important microphone characteristics can be investigated by the presented model and design measures can be identified towards optimized performance w.r.t a higher signal-to-noise ratio, one of the most important key figures for microphone design.
AB - We demonstrate that a comprehensive, physically based system-level approach based on the generalized Kirchhoffian network theory constitutes a reliable basis for the optimization of enhanced industrial MEMS devices and systems. The combination of distributed and lumped system-level models offers detailed insight in the device operation while, at the same time, keeping the computational expense low. The possibility to implement these models into standard system simulators facilitates the co-simulation with the electronic circuitry. The benefits of this modular, tailored system-level modeling approach, which combines lumped with distributed models, are exemplified by applying it to an industrial capacitive silicon microphone. This way, all important microphone characteristics can be investigated by the presented model and design measures can be identified towards optimized performance w.r.t a higher signal-to-noise ratio, one of the most important key figures for microphone design.
UR - http://www.scopus.com/inward/record.url?scp=85096791712&partnerID=8YFLogxK
M3 - Konferenzbeitrag
AN - SCOPUS:85096791712
T3 - MikroSystemTechnik Kongress 2017 "MEMS, Mikroelektronik, Systeme", Proceedings
SP - 793
EP - 796
BT - MikroSystemTechnik Kongress 2017 "MEMS, Mikroelektronik, Systeme", Proceedings
PB - VDE VERLAG GMBH
Y2 - 23 October 2017 through 25 October 2017
ER -