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On the Relation Between Reliability and Entropy in Physical Unclonable Functions

  • Vasilii Kulagin
  • , Sergio Vinagrero Gutierrez
  • , Tobias Kilian
  • , Daniel Tille
  • , Ulf Schlichtmann
  • , Giorgio Di Natale
  • , Elena Ioana Vatajelu
  • University of Grenoble Alpes
  • Infineon Technologies AG
  • Technical University of Munich

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Editor's notes: Physical unclonable functions (PUFs) represent a fundamental component of modern hardware security. Entropy and reliability are two critical metrics used to evaluate the performance of a PUF. In this article, the authors address the correlation between the two, by conducting a set of experiments using ring oscillators from Infineon. - Kanad Basu, University of Texas at Dallas, USA.

Original languageEnglish
Pages (from-to)46-53
Number of pages8
JournalIEEE Design and Test
Volume41
Issue number6
DOIs
StatePublished - 2024

Keywords

  • Entropy
  • Physical Unclonable Functions
  • Reliability
  • Ring Oscillator

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