TY - JOUR
T1 - On the Relation Between Reliability and Entropy in Physical Unclonable Functions
AU - Kulagin, Vasilii
AU - Gutierrez, Sergio Vinagrero
AU - Kilian, Tobias
AU - Tille, Daniel
AU - Schlichtmann, Ulf
AU - Di Natale, Giorgio
AU - Vatajelu, Elena Ioana
N1 - Publisher Copyright:
IEEE
PY - 2024
Y1 - 2024
N2 - Physical Unclonable Functions (PUFs) are integral for generating unique signatures, secret keys, and device identification, leveraging inherent manufacturing process variability. Mathematically defined as functions linking inputs (challenges) to outputs (responses), PUFs exhibit random properties. Key properties for high-quality PUFs include intra-device entropy (random distribution of responses within the same circuit), inter-device entropy (random distribution across different circuits for identical challenges), and reliability (response consistency for identical challenges and the same circuit). Inter-device entropy and reliability may be influenced by design discrepancies, systematic variability, noise, and aging. This paper addresses the correlation between entropy and reliability, providing evidence from an extensive set of circuits featuring diverse Ring Oscillators supplied by Infineon.
AB - Physical Unclonable Functions (PUFs) are integral for generating unique signatures, secret keys, and device identification, leveraging inherent manufacturing process variability. Mathematically defined as functions linking inputs (challenges) to outputs (responses), PUFs exhibit random properties. Key properties for high-quality PUFs include intra-device entropy (random distribution of responses within the same circuit), inter-device entropy (random distribution across different circuits for identical challenges), and reliability (response consistency for identical challenges and the same circuit). Inter-device entropy and reliability may be influenced by design discrepancies, systematic variability, noise, and aging. This paper addresses the correlation between entropy and reliability, providing evidence from an extensive set of circuits featuring diverse Ring Oscillators supplied by Infineon.
KW - Entropy
KW - Entropy
KW - Frequency measurement
KW - Integrated circuit reliability
KW - Physical unclonable function
KW - Physical Unclonable Functions
KW - Reliability
KW - Reliability
KW - Ring Oscillator
KW - Systematics
KW - Temperature measurement
UR - http://www.scopus.com/inward/record.url?scp=85198281774&partnerID=8YFLogxK
U2 - 10.1109/MDAT.2024.3425791
DO - 10.1109/MDAT.2024.3425791
M3 - Article
AN - SCOPUS:85198281774
SN - 2168-2356
SP - 1
JO - IEEE Design and Test
JF - IEEE Design and Test
ER -