On the Relation Between Reliability and Entropy in Physical Unclonable Functions

Vasilii Kulagin, Sergio Vinagrero Gutierrez, Tobias Kilian, Daniel Tille, Ulf Schlichtmann, Giorgio Di Natale, Elena Ioana Vatajelu

Research output: Contribution to journalArticlepeer-review

Abstract

Physical Unclonable Functions (PUFs) are integral for generating unique signatures, secret keys, and device identification, leveraging inherent manufacturing process variability. Mathematically defined as functions linking inputs (challenges) to outputs (responses), PUFs exhibit random properties. Key properties for high-quality PUFs include intra-device entropy (random distribution of responses within the same circuit), inter-device entropy (random distribution across different circuits for identical challenges), and reliability (response consistency for identical challenges and the same circuit). Inter-device entropy and reliability may be influenced by design discrepancies, systematic variability, noise, and aging. This paper addresses the correlation between entropy and reliability, providing evidence from an extensive set of circuits featuring diverse Ring Oscillators supplied by Infineon.

Original languageEnglish
Pages (from-to)1
Number of pages1
JournalIEEE Design and Test
DOIs
StateAccepted/In press - 2024

Keywords

  • Entropy
  • Entropy
  • Frequency measurement
  • Integrated circuit reliability
  • Physical unclonable function
  • Physical Unclonable Functions
  • Reliability
  • Reliability
  • Ring Oscillator
  • Systematics
  • Temperature measurement

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