Abstract
A new numerical analysis tool for the investigation of the three-dimensional transient electromagnetic behavior of interconnect structures in high power modules is presented. The simulator uses the finite element method to receive a continuous field description of electric and magnetic fields caused by bus bars under fast operating conditions and allows for a detailed investigation of distributed parasitic effects. Time dependent current crowding, time dependent inductances, overvoltage peaks or current turn-on delays can be determined. The finite element based concept permits to consider both voltage and current-driven problems and is well suited to analyze complex plate structures as no a priori decomposition of any conductor into partial elements is needed. The interconnect analysis tool was developed by the help of the object-oriented C++ library Diffpack, a software development framework for the solution of partial differential equations. The mixed finite element method is applied to solve the skin effect problem by a combination of a vector and a scalar potential. Edge finite elements are used to discretize the vector quantity. Re-using well-tested and efficient code of the library allows to analyze complex three-dimensional bus bar arrangements.
| Original language | English |
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| Pages (from-to) | 880-884 |
| Number of pages | 5 |
| Journal | PESC Record - IEEE Annual Power Electronics Specialists Conference |
| Volume | 2 |
| State | Published - 2004 |
| Event | 2004 IEEE 35th Annual Power Electronics Specialists Conference, PESC04 - Aachen, Germany Duration: 20 Jun 2004 → 25 Jun 2004 |