TY - GEN
T1 - Numerical analysis of cosmic radiation-induced failures in power diodes
AU - Weiß, Christoph
AU - Aschauer, Stefan
AU - Wachutka, Gerhard
AU - Härtl, Andreas
AU - Hille, Frank
AU - Pfirsch, Frank
PY - 2011
Y1 - 2011
N2 - Silicon power diodes can run into thermal destruction due to cosmic radiation-induced effects. We performed electro-thermal coupled device simulations in order to explain the failure mechanism. The results are compared to ion irradiation experiments. We find a strong heating located at the point where the incident ion deposits charge with a temperature rise which can explain melting of used materials.
AB - Silicon power diodes can run into thermal destruction due to cosmic radiation-induced effects. We performed electro-thermal coupled device simulations in order to explain the failure mechanism. The results are compared to ion irradiation experiments. We find a strong heating located at the point where the incident ion deposits charge with a temperature rise which can explain melting of used materials.
UR - http://www.scopus.com/inward/record.url?scp=82955243711&partnerID=8YFLogxK
U2 - 10.1109/ESSDERC.2011.6044161
DO - 10.1109/ESSDERC.2011.6044161
M3 - Conference contribution
AN - SCOPUS:82955243711
SN - 9781457707056
T3 - European Solid-State Device Research Conference
SP - 355
EP - 358
BT - ESSDERC 2011 - Proceedings of the 41st European Solid-State Device Research Conference
T2 - 41st European Solid-State Device Research Conference, ESSDERC 2011
Y2 - 12 September 2011 through 16 September 2011
ER -