Abstract
A noninstrusive optical measurement technique has been developed for the investigation of two-phase gas I liquid-film flow. The film analyser is capable to measure the thickness of shear or gravity driven wavy liquid films moving along a wall. On the basis of a statistical analysis of the recorded time-resolved film thickness, characteristic parameters of the film structure are calculated. Furthermore, the frequency spectrum and the dominant wave frequencies can be obtained by Fourier transformation. At present the liquid-film analyser is applied to liquid-film flows in atomizers for gas turbine combustors.
| Original language | English |
|---|---|
| Pages (from-to) | 155-160 |
| Number of pages | 6 |
| Journal | Technisches Messen |
| Volume | 54 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 1987 |
| Externally published | Yes |
Keywords
- Flüssigkeitsfilme
- Schichtdickenmessung
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