Non-linear gate length dependence of on-current in Si-Nanowire FETs

W. M. Weber, A. P. Graham, G. S. Duesberg, M. Liebau, C. Cheze, L. Geelhaar, E. Unger, W. Pamler, W. Hoenlein, H. Riechert, F. Kreupl, P. Lugli

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

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Engineering

Material Science