Noise analysis of microwave circuits with general topology

Peter Russer, Stefan Muller

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A method for noise analysis of microwave imports with general internal topology is presented. The multiport circuit is separated into the connection circuit and the circuit elements. Based upon the digraph representation of the connection circuit, the scattering matrix of the connection circuit is computed from the fundamental cut set matrix and the fundamental loop matrix of the connection circuit. From this and the S-parameters of the circuit elements and the correlation spectra of the internal noise sources, the S-matrix of the multiport and the correlation matrix of its external equivalent noise sources may be determined directly. Circuit elements may be noisy two-terminal elements as well as noisy n-terminal elements and noisy multiports.

Original languageEnglish
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherPubl by IEEE
Pages1481-1484
Number of pages4
ISBN (Print)0780306112
StatePublished - 1992
Event1992 IEEE MTT-S International Microwave Symposium Digest Part 3 (of 3) - Albuquerque, NM, USA
Duration: 1 Jun 19925 Jun 1992

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume3
ISSN (Print)0149-645X

Conference

Conference1992 IEEE MTT-S International Microwave Symposium Digest Part 3 (of 3)
CityAlbuquerque, NM, USA
Period1/06/925/06/92

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