New methodology for on-chip RF reliability assessment

Leonhard Heis, Andreas Lachmann, Reiner Schwab, Georgios Panagopoulos, Peter Baumgartner, Mamatha Yakkegondi Virupakshappaa, Doris Schmitt-Landsiedel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

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Engineering