Nanoscale detection of spin wave deflection angles in permalloy

Magnonics is a potential candidate for beyond CMOS and neuromorphic computing technologies with advanced phase encoded logic. However, nanoscale imaging of spin waves with full phase and magnetization amplitude information is a challenge. We show a generalized scanning transmission x-ray microscopy platform to get a complete understanding of spin waves, including the k-vector, phase, and absolute magnetization deflection angle. As an example, this is demonstrated using a 50 nm thin permalloy film where we find a maximum deflection angle of 1.5° and good agreement with the k-vector dispersion previously reported in the literature. With a spatial resolution approximately ten times better than any other methods for spin wave imaging, x-ray microscopy opens a vast range of possibilities for the observation of spin waves and various magnetic structures.