Nanometer focusing properties of Fresnel zone plates described by dynamical diffraction theory

F. Pfeiffer, C. David, J. F. Van Der Veen, C. Bergemann

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

The x-ray focusing properties of linear Fresnel zone plates have been derived by solving the Helmholtz equation for the field propagating through the zones. We consider the imaging of a point object into the first diffraction order of a volume zone plate having its zones parallel to the optical axis. For plane wave illumination, the focal spot size is limited by the same material-dependent but wavelength-independent value that affects waveguide focusing. In marked contrast, for the one-to-one imaging condition, corresponding to specular reflection of the x rays from the zone boundaries, the image is found to have a minimal spot size approximately equal to the outermost zone width. Unlike x-ray waveguides, zone plates therefore do not appear to possess a fundamental limit to the smallest spot size to which they can focus.

Original languageEnglish
Article number245331
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume73
Issue number24
DOIs
StatePublished - 2006
Externally publishedYes

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