Nanomanipulation with 3D visual and force feedback using atomic force microscopes

Wolfgang Vogl; Metin Sitti; Michael F. Zäh

Nanomanipulation with 3D visual and force feedback using atomic force microscopes

Wolfgang Vogl, Metin Sitti, Michael F. Zäh

Chair of Machine Tools and Manufacturing Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

Atomic Force Microscopes (AFM) have been widely used for nanomanipulation throughout the last decade. Due to the design of AFMs, forces exerted on the AFM-tip cannot be resolved in 3D and no visual feedback can be obtained during manipulation. In this paper, we present an augmented reality approach for nanomanipulation interfaces, in which nano-scale 3D topography and force information sensed by the AFM-probe are blended with real time simulations. The sample surface is modeled with a spline-based geometry model, upon which a collision detection algorithm determines, whether and how the spherical AFM-tip penetrates the surface. Based on these results, surface deformations can be simulated in real-time and - up to now impossible - decoupled 3D force sensing can be achieved.

Original language	English
Title of host publication	2004 4th IEEE Conference on Nanotechnology
Pages	349-351
Number of pages	3
State	Published - 2004
Event	2004 4th IEEE Conference on Nanotechnology - Munich, Germany Duration: 16 Aug 2004 → 19 Aug 2004

Publication series

Name	2004 4th IEEE Conference on Nanotechnology

Conference

Conference	2004 4th IEEE Conference on Nanotechnology
Country/Territory	Germany
City	Munich
Period	16/08/04 → 19/08/04

Keywords

Atomic force microscopy
Manipulators
Modeling
Nanotechnology
Robot sensing systems
User interfaces

Cite this

@inproceedings{538078f0513a4fbba73d117b557195ff,

title = "Nanomanipulation with 3D visual and force feedback using atomic force microscopes",

abstract = "Atomic Force Microscopes (AFM) have been widely used for nanomanipulation throughout the last decade. Due to the design of AFMs, forces exerted on the AFM-tip cannot be resolved in 3D and no visual feedback can be obtained during manipulation. In this paper, we present an augmented reality approach for nanomanipulation interfaces, in which nano-scale 3D topography and force information sensed by the AFM-probe are blended with real time simulations. The sample surface is modeled with a spline-based geometry model, upon which a collision detection algorithm determines, whether and how the spherical AFM-tip penetrates the surface. Based on these results, surface deformations can be simulated in real-time and - up to now impossible - decoupled 3D force sensing can be achieved.",

keywords = "Atomic force microscopy, Manipulators, Modeling, Nanotechnology, Robot sensing systems, User interfaces",

author = "Wolfgang Vogl and Metin Sitti and Z{\"a}h, {Michael F.}",

year = "2004",

language = "English",

isbn = "0780385365",

series = "2004 4th IEEE Conference on Nanotechnology",

pages = "349--351",

booktitle = "2004 4th IEEE Conference on Nanotechnology",

note = "2004 4th IEEE Conference on Nanotechnology ; Conference date: 16-08-2004 Through 19-08-2004",

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TY - GEN

T1 - Nanomanipulation with 3D visual and force feedback using atomic force microscopes

AU - Vogl, Wolfgang

AU - Sitti, Metin

AU - Zäh, Michael F.

PY - 2004

Y1 - 2004

N2 - Atomic Force Microscopes (AFM) have been widely used for nanomanipulation throughout the last decade. Due to the design of AFMs, forces exerted on the AFM-tip cannot be resolved in 3D and no visual feedback can be obtained during manipulation. In this paper, we present an augmented reality approach for nanomanipulation interfaces, in which nano-scale 3D topography and force information sensed by the AFM-probe are blended with real time simulations. The sample surface is modeled with a spline-based geometry model, upon which a collision detection algorithm determines, whether and how the spherical AFM-tip penetrates the surface. Based on these results, surface deformations can be simulated in real-time and - up to now impossible - decoupled 3D force sensing can be achieved.

AB - Atomic Force Microscopes (AFM) have been widely used for nanomanipulation throughout the last decade. Due to the design of AFMs, forces exerted on the AFM-tip cannot be resolved in 3D and no visual feedback can be obtained during manipulation. In this paper, we present an augmented reality approach for nanomanipulation interfaces, in which nano-scale 3D topography and force information sensed by the AFM-probe are blended with real time simulations. The sample surface is modeled with a spline-based geometry model, upon which a collision detection algorithm determines, whether and how the spherical AFM-tip penetrates the surface. Based on these results, surface deformations can be simulated in real-time and - up to now impossible - decoupled 3D force sensing can be achieved.

KW - Atomic force microscopy

KW - Manipulators

KW - Modeling

KW - Nanotechnology

KW - Robot sensing systems

KW - User interfaces

UR - http://www.scopus.com/inward/record.url?scp=20344370269&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:20344370269

SN - 0780385365

T3 - 2004 4th IEEE Conference on Nanotechnology

SP - 349

EP - 351

BT - 2004 4th IEEE Conference on Nanotechnology

T2 - 2004 4th IEEE Conference on Nanotechnology

Y2 - 16 August 2004 through 19 August 2004

ER -

Nanomanipulation with 3D visual and force feedback using atomic force microscopes

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Keywords

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