Multiparametric electrochemical characterization of cadmium atomic layer deposition on tellurium

S. M. Rabchynski; E. A. Streltsov; A. S. Bandarenka; G. A. Ragoisha

doi:10.1142/9789812770950_0090

Multiparametric electrochemical characterization of cadmium atomic layer deposition on tellurium

S. M. Rabchynski, E. A. Streltsov, A. S. Bandarenka, G. A. Ragoisha

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Abstract

Cadmium atomic layer electrodeposition above reversible Cd²⁺/Cd potential (underpotential deposition, upd) on bulk tellurium and Te atomic layer predeposited on gold has been characterised with potentiodynamic electrochemical impedance spectroscopy (PDEIS) by variations, with the electrode potential E, of double layer pseudocapacitance Q_dl, charge transfer resistance Rct and Warburg coefficient AW of diffusion impedance.

Original language	English
Title of host publication	Physics, Chemistry and Application of Nanostructures
Subtitle of host publication	Reviews and Short Notes: Proceedings of the International Conference on Nanomeeting 2007 Minsk, Belarus, 22 - 25 May 2007
Publisher	World Scientific Publishing Co.
Pages	400-403
Number of pages	4
ISBN (Electronic)	9789812770950
ISBN (Print)	9812705996, 9789812705990
DOIs	https://doi.org/10.1142/9789812770950_0090
State	Published - 1 Jan 2007
Externally published	Yes

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10.1142/9789812770950_0090

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Rabchynski, S. M., Streltsov, E. A., Bandarenka, A. S., & Ragoisha, G. A. (2007). Multiparametric electrochemical characterization of cadmium atomic layer deposition on tellurium. In Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes: Proceedings of the International Conference on Nanomeeting 2007 Minsk, Belarus, 22 - 25 May 2007 (pp. 400-403). World Scientific Publishing Co.. https://doi.org/10.1142/9789812770950_0090

Rabchynski, S. M. ; Streltsov, E. A. ; Bandarenka, A. S. et al. / Multiparametric electrochemical characterization of cadmium atomic layer deposition on tellurium. Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes: Proceedings of the International Conference on Nanomeeting 2007 Minsk, Belarus, 22 - 25 May 2007. World Scientific Publishing Co., 2007. pp. 400-403

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abstract = "Cadmium atomic layer electrodeposition above reversible Cd2+/Cd potential (underpotential deposition, upd) on bulk tellurium and Te atomic layer predeposited on gold has been characterised with potentiodynamic electrochemical impedance spectroscopy (PDEIS) by variations, with the electrode potential E, of double layer pseudocapacitance Qdl, charge transfer resistance Rct and Warburg coefficient AW of diffusion impedance.",

author = "Rabchynski, {S. M.} and Streltsov, {E. A.} and Bandarenka, {A. S.} and Ragoisha, {G. A.}",

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Rabchynski, SM, Streltsov, EA, Bandarenka, AS & Ragoisha, GA 2007, Multiparametric electrochemical characterization of cadmium atomic layer deposition on tellurium. in Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes: Proceedings of the International Conference on Nanomeeting 2007 Minsk, Belarus, 22 - 25 May 2007. World Scientific Publishing Co., pp. 400-403. https://doi.org/10.1142/9789812770950_0090

Multiparametric electrochemical characterization of cadmium atomic layer deposition on tellurium. / Rabchynski, S. M.; Streltsov, E. A.; Bandarenka, A. S. et al.
Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes: Proceedings of the International Conference on Nanomeeting 2007 Minsk, Belarus, 22 - 25 May 2007. World Scientific Publishing Co., 2007. p. 400-403.

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

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Rabchynski SM, Streltsov EA, Bandarenka AS, Ragoisha GA. Multiparametric electrochemical characterization of cadmium atomic layer deposition on tellurium. In Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes: Proceedings of the International Conference on Nanomeeting 2007 Minsk, Belarus, 22 - 25 May 2007. World Scientific Publishing Co. 2007. p. 400-403 doi: 10.1142/9789812770950_0090

Multiparametric electrochemical characterization of cadmium atomic layer deposition on tellurium

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