Multiparametric characterisation of metal-chalcogen atomic multilayer assembly by potentiodynamic electrochemical impedance spectroscopy

G. A. Ragoisha, A. S. Bondarenko, N. P. Osipovich, S. M. Rabchynski, E. A. Streltsov

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

Fingerprint

Dive into the research topics of 'Multiparametric characterisation of metal-chalcogen atomic multilayer assembly by potentiodynamic electrochemical impedance spectroscopy'. Together they form a unique fingerprint.

Keyphrases

Chemistry

Engineering

Material Science

Physics