Multi-modal scanning X-ray microscopy

Andreas Menzel, Pierre Thibault, Martin Dierolf, Cameron M. Kewish, Franz Pfeiffer, Oliver Bunk

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


Scanning X-ray microscopy offers a wide variety of contrast modes. The combination with coherent diffractive imaging allows image resolution to be increased beyond the size of the X-ray probe.

Original languageEnglish
Title of host publicationFrontiers in Optics, FiO 2009
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528780
StatePublished - 2009
EventFrontiers in Optics, FiO 2009 - San Jose, CA, United States
Duration: 11 Oct 200915 Oct 2009

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


ConferenceFrontiers in Optics, FiO 2009
Country/TerritoryUnited States
CitySan Jose, CA


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