Moiré interferometry formulas for hard X-ray wavefront sensing

Timm Weitkamp, Ana Diaz, Bernd Nöhammer, Franz Pfeiffer, Marco Stampanoni, Eric Ziegler, Christian David

Research output: Contribution to journalConference articlepeer-review

17 Scopus citations


We derive mathematical relations for hard X-ray moiré wavefront analysis with a grating interferometer. In particular, the first derivative of the wavefront phase profile and the local radius of curvature of the wavefront are related to the position and inclination of the observed moiré fringes.

Original languageEnglish
Article number20
Pages (from-to)140-144
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 2004
Externally publishedYes
EventAdvances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications II - Denver, CO, United States
Duration: 5 Aug 20045 Aug 2004


  • Mirror metrology
  • Moiré interferometry
  • Synchrotron radiation
  • X-ray interferometry
  • X-ray optics


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