@article{33e669dea43947b9b42721b5f3902168,
title = "Modeling of the hysteretic metal-insulator transition in a vanadium dioxide infrared detector",
abstract = "The vanadium dioxide (VO2) thin film, usually employed as an infrared detector, exhibits hysteresis in its resistance-temperature characteristic. Considering a polycrystalline VO2 thin film as a composite medium, containing semiconducting and metallic microcrystals, the well-known effective-medium approximation theory is employed to relate the volume fraction of the semiconducting microcrystals to the effective film resistance. A phenomenological model is first proposed for describing the hysteretic dependence of volume fraction on temperature. From this, a model for hysteresis in the resistance-temperature characteristic is then derived, and a procedure for estimating the model parameters is outlined. The model reproduces the more important hysteretic characteristics such as the major, minor, and nested loops, in good agreement with the experimental characteristics.",
keywords = "Accommodation process, Composite medium, Effective-medium approximation, Hysteresis model, Infrared imaging, Major loop, Metal-insulator transition, Microbolometer, Minor loop, Percolation, Phase transition, Sensor, Thermal hysteresis, Vanadium dioxide",
author = "\{De Almeida\}, \{Luiz Alberto Luz\} and Deep, \{Gurdip Singh\} and Lima, \{Antonio Marcus Nogueira\} and Helmut Neff",
note = "Funding Information: This paper deals only with the static features of the R-T characteristics of a VO2 thin film. The effect of incident radiation is not addressed. We have also devised a model that, together with thermodynamic equilibrium equation, can be employed for microbolometer performance analysis even in the hysteretic transition region. This development is being carried out at present. Acknowledgments The authors thank CNPq (Conselho Nacional de Desen-volvimento Cient{\'i}fico e Tecnol{\'o}gico), CAPES (Fundac¸{\~a}o Coordenac¸{\~a}o de Aperfeic¸oamento de Pessoal de N{\'i}vel Superior), and DAAD (German Academic Exchange Service) for the award of research and study fellowships during the course of these investigations. Thanks are also due to Professor Igor A. Khrebtov of the S. I. Vavilov State Optical Institute, St. Petersburg, Russia, for providing the VO2 films. References 1. H. Choi, J. Ahm, J. Jung, T. Noh, and D. Kim, Phys. Rev. B 54(7), 4621{\textendash}4628 (1996). 2. H. Jerominek, F. Picard, and D. Vincent, Opt. Eng. 32(9), 2092{\textendash}2099 (1993). 3. C. Reintsema, E. Grossman, and J. Koch, Eds., Infrared Technology and Applications XXV, Proc. SPIE 3698, 190{\textendash}200 (1999). 4. C. Chen, X. Yi, X. Zhao, and B. Xiong, in 25th International Confer-ence on Infrared and Millimeter Waves, pp. 211{\textendash}212 (2000). 5. L. A. L. de Almeida, G. S. Deep, A. M. N. Lima, H. Neff, and R. C. S. Freire, IEEE Trans. Instrum. Meas. 50(4), 1030{\textendash}1035 (2001). 6. K. C. Liddiard, Infrared Phys. 26(1), 43{\textendash}49 (1986). 7. D. Stauffer and A. Aharony, Introduction to Percolation Theory, Tay-lor and Francis (1994). 8. D. Stroud, Superlattices Microstruct. 23(3{\textendash}4), 567{\textendash}573 (1998). 9. T. W. Noh and P. H. Song, Phys. Rev. B 44(11), 5459{\textendash}5464 (1991). 10. P. Potapov, R. Gotthardt, and L. Bataillard, Phys. Status Solidi A 165(2), 401{\textendash}408 (1998). 11. K. Otsuka and C. M. Wayman, Shape Memory Materials, Cambridge University Press (1998). 12. A. M. N. Lima, G. S. Deep, L. A. L. de Almeida, H. Neff, and M.",
year = "2002",
month = oct,
doi = "10.1117/1.1501095",
language = "English",
volume = "41",
pages = "2582--2588",
journal = "Optical Engineering",
issn = "0091-3286",
publisher = "SPIE",
number = "10",
}