Abstract
The optimum performance of power modules and circuits is confined by the action of parasitic inductive effects such as eddy currents. Three dimensional finite element analysis of the dynamic behavior of the electromagnetic fields under transient switching conditions is used to study the resulting current distribution in bus bars. The computed current distributions demonstrated current crowding along the contact edges and the narrow passages of the conductor. These results serve as initial data to compute the transient current distributions allowing for the simulation of eddy currents and skin effect.
| Original language | English |
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| Pages | 129-132 |
| Number of pages | 4 |
| State | Published - 1997 |
| Event | Proceedings of the 1997 9th International Symposium on Power Semiconductor Devices and ICs, ISPSD - Weimer, Ger Duration: 26 May 1997 → 29 May 1997 |
Conference
| Conference | Proceedings of the 1997 9th International Symposium on Power Semiconductor Devices and ICs, ISPSD |
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| City | Weimer, Ger |
| Period | 26/05/97 → 29/05/97 |