Modeling of NBTI-recovery effects in analog CMOS circuits

Keyphrases

• Recovery Effect 100%
• Analog CMOS Circuits 100%
• Simulation Model 66%
• CMOS Circuits 66%
• Bias Temperature Instability 66%
• Vth Shift 66%
• Erroneous Behaviors 33%
• Analog-to-digital Converter 33%
• Spices 33%
• Analog Circuits 33%
• Aging Simulation 33%
• Circuit Topology 33%
• Offset Compensation 33%
• Transient Response 33%
• Parameter Shifts 33%
• Fast Characterization 33%
• Instability Model 33%
• DC Stress 33%
• Stress Pulse 33%
• AC Stress 33%
• NBTI Degradation 33%
• Auto-zero 33%
• Analytic Bias 33%
• Switched-capacitor Techniques 33%
• Simulation Time-step 33%

Engineering

• Simulation Model 100%
• Comparator 100%
• Transient Analysis 50%
• SPICE 50%
• Switched Capacitor 50%
• Electric Network Topology 50%
• Simulation Time 50%
• Analog Circuit 50%
• Analog-to-Digital Converter 50%
• Stress Pulse 50%

Biochemistry, Genetics and Molecular Biology

• Step Time 100%
• Pulse Rate 100%