Modeling of DEPFET based X-ray detectors for athena's wide field imager

Sabine Ott, Robert Andritschke, Alexander Bähr, Norbert Meidinger, Johannes Müller-Seidlitz, Markus Plattner, Walter Stechele, Wolfgang Treberspurg

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The X-ray observatory Athena (Advanced Telescope for High Energy Astrophysics) is an ESA satellite to be launched in 2028. One of the two focal plane instruments is the Wide Field Imager (WFI). WFI is an X-ray camera for imaging and spectroscopic applications. Its detector consists of active pixel DEPFET (Depleted P-channel Field Effect Transistors) sensors with front-end electronics. Mathematical models of the DEPFET detector were developed to be used in an emulator system. This emulator system will be utilized for an end-to-end evaluation, to verify and characterize the detector, the detector electronics, data analysis, and onboard processing. The developed emulator models simulate physical effects and behavior of the DEPFET detector. The adjustable parameters of these models comprise detector architecture, characteristics, and environmental influences. Furthermore algorithms for generating an input data stack of X-ray photons with a particular energy, spatial distribution, and hit time are provided. First results of a comparison of a simulated and measured spectra of a 55Fe source show good agreement. Iterative adjustment of simulation models based on measurements of Athena prototype DEPFET devices will lead to a continuous improvement of the emulator models. This manuscript will give a detailed summary of the emulator models of the WFI DEPFET detector. Results of an event threshold analysis with a data stack generated by the emulator models are discussed. The key advantages of the WFI evaluation with the detector emulator in view of the long-term development for space applications are outlined.

Original languageEnglish
Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016426
DOIs
StatePublished - 16 Oct 2017
Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Duration: 29 Oct 20166 Nov 2016

Publication series

Name2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Conference

Conference2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Country/TerritoryFrance
CityStrasbourg
Period29/10/166/11/16

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