Model-driven engineering and semantic technologies for the design of cyber-physical systems

S. Feldmann, S. Rösch, D. Schütz, B. Vogel-Heuser

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

Rapid changes in product and system requirements force today's companies to cope with unforeseen adaptations of industrial plants. To enable the implementation of intelligent, self-adapting systems, manufacturing systems must be composed to Cyber-Physical Systems (CPS) out of Cyber-Physical Modules (CPMs). However, cross-disciplinary design of CPS and the multitude of persons involved in this process increases complexity in (re-)engineering drastically. Identification and modeling of typical CPM types in a CPM library provides a first step towards enabling reuse of constructed and verified CPMs and, thus, a knowledge base making automatic composition of CPS out of CPMs possible. In this paper, a concept for retrieving existing automation software functionality from a given hardware description by means of model-driven engineering and semantic technologies is presented.

Original languageEnglish
Title of host publication11th IFAC Workshop on Intelligent Manufacturing Systems, IMS 2013
PublisherIFAC Secretariat
Pages210-215
Number of pages6
Edition7
ISBN (Print)9783902823335
DOIs
StatePublished - 2013
Event11th IFAC Workshop on Intelligent Manufacturing Systems, IMS 2013 - Sao Paulo, Brazil
Duration: 22 May 201324 May 2013

Publication series

NameIFAC Proceedings Volumes (IFAC-PapersOnline)
Number7
Volume46
ISSN (Print)1474-6670

Conference

Conference11th IFAC Workshop on Intelligent Manufacturing Systems, IMS 2013
Country/TerritoryBrazil
CitySao Paulo
Period22/05/1324/05/13

Keywords

  • Cyber-physical systems
  • Knowledge-based systems
  • Manufacturing systems

Fingerprint

Dive into the research topics of 'Model-driven engineering and semantic technologies for the design of cyber-physical systems'. Together they form a unique fingerprint.

Cite this