TY - JOUR
T1 - Model-based test case generation for smart cards
AU - Philipps, J.
AU - Pretschner, A.
AU - Slotosch, O.
AU - Aiglstorfer, E.
AU - Kriebel, S.
AU - Scholl, K.
N1 - Funding Information:
1 Support by the BMBF (project EMPRESS) is gratefully acknowledged. 2 Email: {philipps,pretschner,slotosch}@validas.de 3 Email: {Ernst.Aiglstorfer,Stefan.Kriebel,Kai.Scholl}@de.gi-de.com
PY - 2003/8
Y1 - 2003/8
N2 - Testing denotes a set of activities that aim at discovering discrepancies between actual and intended behaviors of a system. Often, the intended behavior is known only implicitly, which renders the process of testing unstructured, unmotivated in its details, and barely reproducible. The use of explicit and executable models to describe the intended behavior promises to solve these problems. We use an industrial case study - a smart card application - to present a method for automatically generating test cases from such explicit models. The test cases are used both to validate the model and verify the actual card.
AB - Testing denotes a set of activities that aim at discovering discrepancies between actual and intended behaviors of a system. Often, the intended behavior is known only implicitly, which renders the process of testing unstructured, unmotivated in its details, and barely reproducible. The use of explicit and executable models to describe the intended behavior promises to solve these problems. We use an industrial case study - a smart card application - to present a method for automatically generating test cases from such explicit models. The test cases are used both to validate the model and verify the actual card.
KW - CASE
KW - Modeling languages
KW - Smart cards
KW - Test case generation
UR - http://www.scopus.com/inward/record.url?scp=3943053042&partnerID=8YFLogxK
U2 - 10.1016/S1571-0661(04)80817-X
DO - 10.1016/S1571-0661(04)80817-X
M3 - Conference article
AN - SCOPUS:3943053042
SN - 1571-0661
VL - 80
SP - 170
EP - 184
JO - Electronic Notes in Theoretical Computer Science
JF - Electronic Notes in Theoretical Computer Science
T2 - Eight International Workshop on Formal Methods for Industrial Critical Systems (FMICS'03)
Y2 - 5 June 2003 through 7 June 2003
ER -