Millimeter wave surface impedance and far infrared reflectivity of epitaxially grown high Tc thin films

N. Klein; H. Chaloupka; G. Müller; S. Orbach; H. Piel; H. Soltner; U. Poppe; K. Urban; B. Roas; L. Schultz; J. Geerk; F. Vassenden; P. Berberich; H. Kinder; K. F. Renk; J. Schützmann

doi:10.1117/12.2301414

Millimeter wave surface impedance and far infrared reflectivity of epitaxially grown high T_c thin films

N. Klein, H. Chaloupka, G. Müller, S. Orbach, H. Piel, H. Soltner, U. Poppe, K. Urban, B. Roas, L. Schultz, J. Geerk, F. Vassenden, P. Berberich, H. Kinder, K. F. Renk, J. Schützmann

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

Microwave surface impedance data at 87GHz of epitaxially grown thin films of YBa₂Cu₃O_7-δ prepared in situ by excimer laser ablation, dc sputtering, and thermal cvaporation on SrTiO₃, MgO, and LaAlO₃ are compared. At 77K the lowest surface resistance values were achieved with laser ablated films on SrTiO₃. At 4.2 K and low field levels for all preparation techniques and all substrates nearly the same anomalous high residual surface resistance values occur. Both the microwave and the far infrared reflectivity data at 4.2K are described consistently within the two fluid model indicating a large amount of remaining normal conducting charge carriers.

Original language	English
Article number	151404
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1514
DOIs	https://doi.org/10.1117/12.2301414
State	Published - 1990
Event	15th International Conference on Infrared and Millimeter Waves 1990 - Orlando, United States Duration: 10 Dec 1990 → 14 Dec 1990

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Klein, N., Chaloupka, H., Müller, G., Orbach, S., Piel, H., Soltner, H., Poppe, U., Urban, K., Roas, B., Schultz, L., Geerk, J., Vassenden, F., Berberich, P., Kinder, H., Renk, K. F., & Schützmann, J. (1990). Millimeter wave surface impedance and far infrared reflectivity of epitaxially grown high T_c thin films. Proceedings of SPIE - The International Society for Optical Engineering, 1514, Article 151404. https://doi.org/10.1117/12.2301414

@article{6dd1bc8be05d4161890b685cc498c962,

title = "Millimeter wave surface impedance and far infrared reflectivity of epitaxially grown high Tc thin films",

abstract = "Microwave surface impedance data at 87GHz of epitaxially grown thin films of YBa2Cu3O7-δ prepared in situ by excimer laser ablation, dc sputtering, and thermal cvaporation on SrTiO3, MgO, and LaAlO3 are compared. At 77K the lowest surface resistance values were achieved with laser ablated films on SrTiO3. At 4.2 K and low field levels for all preparation techniques and all substrates nearly the same anomalous high residual surface resistance values occur. Both the microwave and the far infrared reflectivity data at 4.2K are described consistently within the two fluid model indicating a large amount of remaining normal conducting charge carriers.",

author = "N. Klein and H. Chaloupka and G. M{\"u}ller and S. Orbach and H. Piel and H. Soltner and U. Poppe and K. Urban and B. Roas and L. Schultz and J. Geerk and F. Vassenden and P. Berberich and H. Kinder and Renk, {K. F.} and J. Sch{\"u}tzmann",

note = "Publisher Copyright: {\textcopyright} (1990) 2017 SPIE.; 15th International Conference on Infrared and Millimeter Waves 1990 ; Conference date: 10-12-1990 Through 14-12-1990",

year = "1990",

doi = "10.1117/12.2301414",

language = "English",

volume = "1514",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

}

Klein, N, Chaloupka, H, Müller, G, Orbach, S, Piel, H, Soltner, H, Poppe, U, Urban, K, Roas, B, Schultz, L, Geerk, J, Vassenden, F, Berberich, P, Kinder, H, Renk, KF & Schützmann, J 1990, 'Millimeter wave surface impedance and far infrared reflectivity of epitaxially grown high T_c thin films', Proceedings of SPIE - The International Society for Optical Engineering, vol. 1514, 151404. https://doi.org/10.1117/12.2301414

TY - JOUR

T1 - Millimeter wave surface impedance and far infrared reflectivity of epitaxially grown high Tc thin films

AU - Klein, N.

AU - Chaloupka, H.

AU - Müller, G.

AU - Orbach, S.

AU - Piel, H.

AU - Soltner, H.

AU - Poppe, U.

AU - Urban, K.

AU - Roas, B.

AU - Schultz, L.

AU - Geerk, J.

AU - Vassenden, F.

AU - Berberich, P.

AU - Kinder, H.

AU - Renk, K. F.

AU - Schützmann, J.

PY - 1990

Y1 - 1990

N2 - Microwave surface impedance data at 87GHz of epitaxially grown thin films of YBa2Cu3O7-δ prepared in situ by excimer laser ablation, dc sputtering, and thermal cvaporation on SrTiO3, MgO, and LaAlO3 are compared. At 77K the lowest surface resistance values were achieved with laser ablated films on SrTiO3. At 4.2 K and low field levels for all preparation techniques and all substrates nearly the same anomalous high residual surface resistance values occur. Both the microwave and the far infrared reflectivity data at 4.2K are described consistently within the two fluid model indicating a large amount of remaining normal conducting charge carriers.

AB - Microwave surface impedance data at 87GHz of epitaxially grown thin films of YBa2Cu3O7-δ prepared in situ by excimer laser ablation, dc sputtering, and thermal cvaporation on SrTiO3, MgO, and LaAlO3 are compared. At 77K the lowest surface resistance values were achieved with laser ablated films on SrTiO3. At 4.2 K and low field levels for all preparation techniques and all substrates nearly the same anomalous high residual surface resistance values occur. Both the microwave and the far infrared reflectivity data at 4.2K are described consistently within the two fluid model indicating a large amount of remaining normal conducting charge carriers.

UR - http://www.scopus.com/inward/record.url?scp=85075501348&partnerID=8YFLogxK

U2 - 10.1117/12.2301414

DO - 10.1117/12.2301414

M3 - Conference article

AN - SCOPUS:85075501348

SN - 0277-786X

VL - 1514

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

M1 - 151404

T2 - 15th International Conference on Infrared and Millimeter Waves 1990

Y2 - 10 December 1990 through 14 December 1990

ER -

Millimeter wave surface impedance and far infrared reflectivity of epitaxially grown high T_c thin films

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