Abstract
Highly-sensitive mid-infrared microscopy is reported. Subwavelength resolution is achieved by detecting absorption through local sample expansion. High sensitivity is obtained by moving laser pulses repetition rate in resonance with the atomic force microscope cantilever eigenfrequency.
| Original language | English |
|---|---|
| Title of host publication | CLEO |
| Subtitle of host publication | Science and Innovations, CLEO_SI 2011 |
| State | Published - 2011 |
| Externally published | Yes |
| Event | CLEO: Science and Innovations, CLEO_SI 2011 - Baltimore, MD, United States Duration: 1 May 2011 → 6 May 2011 |
Publication series
| Name | Optics InfoBase Conference Papers |
|---|---|
| ISSN (Electronic) | 2162-2701 |
Conference
| Conference | CLEO: Science and Innovations, CLEO_SI 2011 |
|---|---|
| Country/Territory | United States |
| City | Baltimore, MD |
| Period | 1/05/11 → 6/05/11 |