Microstructures and electrical conductivity of nanocrystalline ceria-based thin films

Ceria-based thin films are potential materials for use as gas-sensing layers and electrolytes in micro-solid oxide fuel cells. Since the average grain sizes of these films are on the nanocrystalline scale (< 150 nm), it is of fundamental interest whether the electrical conductivity might differ from microcrystalline ceria-based ceramics. In this study, CeO₂ and Ce_0.8Gd_0.2O_1.9-x thin films have been fabrication by spray pyrolysis and pulsed laser deposition, and the influence of the ambient average grain size on the total DC conductivity is investigated. Dense and crack-free CeO₂ and Ce_0.8Gd_0.2O_1.9-x thin films were produced that withstand annealing up to temperatures of 1100 °C. The dopant concentration and annealing temperature affect highly the grain growth kinetics of ceria-based thin films. Large concentrations of dopant exert Zener drag on grain growth and result in retarded grain growth. An increased total DC conductivity and decreased activation energy was observed when the average grain size of a CeO₂ or Ce_0.8Gd_0.2O_1.9-x thin film was decreased.