Abstract
We applied ultrasmall angle X-ray scattering (USAX) in the context of pressure sensitive adhesive (PSA) debonding. Microscopic structures, as detected by USAX, complete macroscopic structural information from standard optical microscopy. As a model PSA, a statistical copolymer was investigated. Asymmetric USAX pattern were detected. The data are modelled by a tilted one-dimensional grating of slits.
| Original language | English |
|---|---|
| Pages (from-to) | 144-147 |
| Number of pages | 4 |
| Journal | Physica B: Condensed Matter |
| Volume | 357 |
| Issue number | 1-2 SPEC. ISS. |
| DOIs | |
| State | Published - 28 Feb 2005 |
Keywords
- Adhesive
- Asymmetry
- In situ
- USAX
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