Microscopic structure in pressure sensitive adhesives: An ultrasmall angle X-ray study

E. Maurer, S. Loi, D. Wulff, N. Willenbacher, P. Müller-Buschbaum

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

We applied ultrasmall angle X-ray scattering (USAX) in the context of pressure sensitive adhesive (PSA) debonding. Microscopic structures, as detected by USAX, complete macroscopic structural information from standard optical microscopy. As a model PSA, a statistical copolymer was investigated. Asymmetric USAX pattern were detected. The data are modelled by a tilted one-dimensional grating of slits.

Original languageEnglish
Pages (from-to)144-147
Number of pages4
JournalPhysica B: Condensed Matter
Volume357
Issue number1-2 SPEC. ISS.
DOIs
StatePublished - 28 Feb 2005

Keywords

  • Adhesive
  • Asymmetry
  • In situ
  • USAX

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