Micro and nano-tomography at the GKSS imaging beamline at PETRA III

A. Haibel, M. Ogurreck, F. Beckmann, T. Dose, F. Wilde, J. Herzen, M. Müller, A. Schreyer, V. Nazmov, M. Simon, A. Last, J. Mohr

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

39 Scopus citations

Abstract

The unique beam characteristics of PETRA III at DESY promote novel applications for many scientific fields, including imaging applications. For tomography these are techniques like high-speed and in-situ measurements marked by highest density resolutions and spatial resolutions down to the nanometer range. Furthermore, the high coherence enables phase contrast applications in an exceptional way. Therefore, the Imaging Beamline IBL is equipped with two dedicated endstations, one for micro and one for nano tomography. In addition, a very flexible X-ray and light optics concept is implemented. The micro tomography endstation is designed for samples requiring (sub-) micrometer resolution. The technical specifications of the nano tomography endstation aim for a spatial resolution of below 100 nm. The nanometer resolution will be achieved by using different combinations of compound refractive lenses as X-ray optics. The overall setup is designed to be very flexible, which allows also the implementation of other optical elements as well as the application of different magnifying techniques.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography VII
DOIs
StatePublished - 2010
Externally publishedYes
EventDevelopments in X-Ray Tomography VII - San Diego, CA, United States
Duration: 2 Aug 20105 Aug 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7804
ISSN (Print)0277-786X

Conference

ConferenceDevelopments in X-Ray Tomography VII
Country/TerritoryUnited States
CitySan Diego, CA
Period2/08/105/08/10

Keywords

  • PETRA III
  • micro tomography
  • nano tomography
  • synchrotron tomography

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