Metric-driven mesh optimization using a local simulated annealing algorithm

We report on results obtained with a metric-driven mesh optimization procedure for simplicial meshes based on the simulated annealing (SA) method. The use of SA improves the chances of removing pathological clusters of bad elements, that have the tendency to lock into frozen configurations in difficult regions of the model such as corners and complex face intersections, prejudicing the overall quality of the final grid. A local version of the algorithm is developed that significantly lowers the computational cost. Numerical examples illustrate the effectiveness of the proposed methodology, which is compared to a classical greedy Gauss-Seidel optimization. Substantial improvement in the quality of the worst elements of the grid is observed for the local simulated annealing optimization. Furthermore, the method appears to be robust to the choice of the algorithmic parameters.