Methods of parameter variations

Christoph Knoth; Ulf Schlichtmann; Bing Li; Min Zhang; Markus Olbrich; Emrah Acar; Uwe Eichler; Joachim Haase; André Lange; Michael Pronath

doi:10.1007/978-1-4419-6621-6_4

Methods of parameter variations

Christoph Knoth
, Ulf Schlichtmann
, Bing Li
, Min Zhang
, Markus Olbrich
, Emrah Acar
, Uwe Eichler
, Joachim Haase
, André Lange
, Michael Pronath

Chair of Electronic Design Automation

Technical University of Munich
Leibniz Universität Hannover
Ibm Research
Fraunhofer IIS/EAS
MunEDA GmbH

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

1 Scopus citations

Abstract

Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.

Original language	English
Title of host publication	Process Variations and Probabilistic Integrated Circuit Design
Publisher	Springer New York
Pages	91-179
Number of pages	89
Volume	9781441966216
ISBN (Electronic)	9781441966216
ISBN (Print)	144196620X, 9781441966209
DOIs	https://doi.org/10.1007/978-1-4419-6621-6_4
State	Published - 1 Sep 2012

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10.1007/978-1-4419-6621-6_4

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author = "Christoph Knoth and Ulf Schlichtmann and Bing Li and Min Zhang and Markus Olbrich and Emrah Acar and Uwe Eichler and Joachim Haase and Andr{\'e} Lange and Michael Pronath",

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AU - Knoth, Christoph

AU - Schlichtmann, Ulf

AU - Li, Bing

AU - Zhang, Min

AU - Olbrich, Markus

AU - Acar, Emrah

AU - Eichler, Uwe

AU - Haase, Joachim

AU - Lange, André

AU - Pronath, Michael

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N2 - Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.

AB - Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.

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DO - 10.1007/978-1-4419-6621-6_4

M3 - Chapter

AN - SCOPUS:84949180073

SN - 144196620X

SN - 9781441966209

VL - 9781441966216

SP - 91

EP - 179

BT - Process Variations and Probabilistic Integrated Circuit Design

PB - Springer New York

ER -

Methods of parameter variations

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