Abstract
The g = 1.933 (g = 1.925) spin-resonance signals observed in thin films of a-Si:H (a-Ge:H) are discussed. Mo5+-ions formed through the incorporation of MoO2 or MoO3 molecules in the semiconducting films are proposed as the microscopic origin of these resonances. Evidence for the electronic activity of these defect levels is presented.
Original language | English |
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Pages (from-to) | 414-416 |
Number of pages | 3 |
Journal | Journal of Non-Crystalline Solids |
Volume | 114 |
Issue number | PART 2 |
DOIs | |
State | Published - 2 Dec 1989 |
Externally published | Yes |