Metal impurities in a-Si:H and other amorphous semiconductors

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Abstract

The g = 1.933 (g = 1.925) spin-resonance signals observed in thin films of a-Si:H (a-Ge:H) are discussed. Mo5+-ions formed through the incorporation of MoO2 or MoO3 molecules in the semiconducting films are proposed as the microscopic origin of these resonances. Evidence for the electronic activity of these defect levels is presented.

Original languageEnglish
Pages (from-to)414-416
Number of pages3
JournalJournal of Non-Crystalline Solids
Volume114
Issue numberPART 2
DOIs
StatePublished - 2 Dec 1989
Externally publishedYes

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