Metal deposition near the tip of a scanning tunneling microscope

J. Divisek; B. Steffen; U. Stimming; Wolfgang Schmickler

doi:10.1016/s0022-0728(97)80053-8

Metal deposition near the tip of a scanning tunneling microscope

J. Divisek, B. Steffen, U. Stimming, Wolfgang Schmickler

Research output: Contribution to journal › Article › peer-review

Abstract

We have performed model calculations for the deposition of metal ions in the vicinity of the tip of a scanning tunneling microscope. Our results show that near the tip mass transport towards the substrate is greatly reduced. These findings may explain shielding effects that have been observed experimentally.

Original language	English
Pages (from-to)	169-172
Number of pages	4
Journal	Journal of Electroanalytical Chemistry
Volume	440
Issue number	1-2
DOIs	https://doi.org/10.1016/s0022-0728(97)80053-8
State	Published - 20 Dec 1997
Externally published	Yes

Keywords

Metal ions
Scanning tunneling microscope (STM)
Shielding effects

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10.1016/s0022-0728(97)80053-8

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title = "Metal deposition near the tip of a scanning tunneling microscope",

abstract = "We have performed model calculations for the deposition of metal ions in the vicinity of the tip of a scanning tunneling microscope. Our results show that near the tip mass transport towards the substrate is greatly reduced. These findings may explain shielding effects that have been observed experimentally.",

keywords = "Metal ions, Scanning tunneling microscope (STM), Shielding effects",

author = "J. Divisek and B. Steffen and U. Stimming and Wolfgang Schmickler",

year = "1997",

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doi = "10.1016/s0022-0728(97)80053-8",

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AU - Divisek, J.

AU - Steffen, B.

AU - Stimming, U.

AU - Schmickler, Wolfgang

PY - 1997/12/20

Y1 - 1997/12/20

N2 - We have performed model calculations for the deposition of metal ions in the vicinity of the tip of a scanning tunneling microscope. Our results show that near the tip mass transport towards the substrate is greatly reduced. These findings may explain shielding effects that have been observed experimentally.

AB - We have performed model calculations for the deposition of metal ions in the vicinity of the tip of a scanning tunneling microscope. Our results show that near the tip mass transport towards the substrate is greatly reduced. These findings may explain shielding effects that have been observed experimentally.

KW - Metal ions

KW - Scanning tunneling microscope (STM)

KW - Shielding effects

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DO - 10.1016/s0022-0728(97)80053-8

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EP - 172

JO - Journal of Electroanalytical Chemistry

JF - Journal of Electroanalytical Chemistry

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Metal deposition near the tip of a scanning tunneling microscope

Abstract

Keywords

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