Message from the Organizers

Matteo Biagiola; Nicol s. Cardozo; Foutse Khomh; Vincenzo Riccio; Donghwan Shin; Andrea Stocco

doi:10.1109/DeepTest59248.2023.00005

Message from the Organizers

Matteo Biagiola, Nicol s. Cardozo, Foutse Khomh, Vincenzo Riccio, Donghwan Shin, Andrea Stocco

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Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	VI
Journal	Proceedings - 2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2023
DOIs	https://doi.org/10.1109/DeepTest59248.2023.00005
State	Published - 2023
Event	2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2023 - Melbourne, Australia Duration: 15 May 2023 → …

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10.1109/DeepTest59248.2023.00005

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@article{6071e6fcc6d0405a853c047e2d66f967,

title = "Message from the Organizers",

author = "Matteo Biagiola and Cardozo, {Nicol s.} and Foutse Khomh and Vincenzo Riccio and Donghwan Shin and Andrea Stocco",

year = "2023",

doi = "10.1109/DeepTest59248.2023.00005",

language = "English",

pages = "VI",

journal = "Proceedings - 2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2023",

note = "2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2023 ; Conference date: 15-05-2023",

}

TY - JOUR

T1 - Message from the Organizers

AU - Biagiola, Matteo

AU - Cardozo, Nicol s.

AU - Khomh, Foutse

AU - Riccio, Vincenzo

AU - Shin, Donghwan

AU - Stocco, Andrea

PY - 2023

Y1 - 2023

UR - http://www.scopus.com/inward/record.url?scp=85169107629&partnerID=8YFLogxK

U2 - 10.1109/DeepTest59248.2023.00005

DO - 10.1109/DeepTest59248.2023.00005

M3 - Editorial

AN - SCOPUS:85169107629

SP - VI

JO - Proceedings - 2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2023

JF - Proceedings - 2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2023

T2 - 2023 IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2023

Y2 - 15 May 2023

ER -

Message from the Organizers

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