Measurement setup for X-Parameter characterization of bulk acoustic wave resonators

W. Akstaller, A. Tag, C. Musolff, R. Weigel, A. Hagelauer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

In this work a modern measurement method has been utilized in order to characterize nonlinear behavior of bulk acoustic wave (BAW) solidly mounted resonators (SMR). Unlike typical nonlinearity characterization methods, the method which was employed here not only records amplitudes, but also the phase of generated harmonics. Furthermore, the relations between the harmonics of different order are given. The modeling approach being used is the poly harmonic distortion (PHD) modeling approach, realized by the measurement of X-Parameters. For that purpose it was necessary to extend a nonlinear vector network analyzer (NVNA) by external components in order to enable high power measurements. Afterwards, several optimization steps were required to perform phase calibration. This difficulty arose due to the high power incident tones and steep resonator impedance curves on the one hand and the limited power provided by the phase calibration standard on the other hand.

Original languageEnglish
Title of host publication85th ARFTG Microwave Measurement Conference
Subtitle of host publicationMeasurements and Techniques for 5G Applications, ARFTG 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479988860
DOIs
StatePublished - 17 Jul 2015
Externally publishedYes
Event85th ARFTG Microwave Measurement Conference, ARFTG 2015 - Phoenix, United States
Duration: 22 May 2015 → …

Publication series

Name85th ARFTG Microwave Measurement Conference: Measurements and Techniques for 5G Applications, ARFTG 2015

Conference

Conference85th ARFTG Microwave Measurement Conference, ARFTG 2015
Country/TerritoryUnited States
CityPhoenix
Period22/05/15 → …

Keywords

  • Bulk Acoustic Wave (BAW)
  • Nonlinear Vector Network Analyzer (NVNA)
  • X-parameters
  • nonlinear characterization

Fingerprint

Dive into the research topics of 'Measurement setup for X-Parameter characterization of bulk acoustic wave resonators'. Together they form a unique fingerprint.

Cite this