Measurement of the Si32 half-life via accelerator mass spectrometry

W. Kutschera; W. Henning; M. Paul; R. K. Smither; E. J. Stephenson; J. L. Yntema; D. E. Alburger; J. B. Cumming; G. Harbottle

doi:10.1103/PhysRevLett.45.592

Measurement of the Si32 half-life via accelerator mass spectrometry

W. Kutschera
, W. Henning
, M. Paul
, R. K. Smither
, E. J. Stephenson
, J. L. Yntema
, D. E. Alburger
, J. B. Cumming
, G. Harbottle

Argonne National Laboratory
The Hebrew University of Jerusalem
Indiana University Cyclotron Facility
Brookhaven National Laboratory

Research output: Contribution to journal › Article › peer-review

64 Scopus citations

Abstract

The half-life of Si32 has been measured to be T12=101±18 yr, considerably shorter than the previously accepted value of 300 yr. The new value was obtained by measuring the specific β activity with a liquid-scintillation-counter technique and the Si32 concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic Si32.

Original language	English
Pages (from-to)	592-596
Number of pages	5
Journal	Physical Review Letters
Volume	45
Issue number	8
DOIs	https://doi.org/10.1103/PhysRevLett.45.592
State	Published - 1980
Externally published	Yes

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10.1103/PhysRevLett.45.592

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title = "Measurement of the Si32 half-life via accelerator mass spectrometry",

abstract = "The half-life of Si32 has been measured to be T12=101±18 yr, considerably shorter than the previously accepted value of 300 yr. The new value was obtained by measuring the specific β activity with a liquid-scintillation-counter technique and the Si32 concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic Si32.",

author = "W. Kutschera and W. Henning and M. Paul and Smither, \{R. K.\} and Stephenson, \{E. J.\} and Yntema, \{J. L.\} and Alburger, \{D. E.\} and Cumming, \{J. B.\} and G. Harbottle",

year = "1980",

doi = "10.1103/PhysRevLett.45.592",

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journal = "Physical Review Letters",

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T1 - Measurement of the Si32 half-life via accelerator mass spectrometry

AU - Kutschera, W.

AU - Henning, W.

AU - Paul, M.

AU - Smither, R. K.

AU - Stephenson, E. J.

AU - Yntema, J. L.

AU - Alburger, D. E.

AU - Cumming, J. B.

AU - Harbottle, G.

PY - 1980

Y1 - 1980

N2 - The half-life of Si32 has been measured to be T12=101±18 yr, considerably shorter than the previously accepted value of 300 yr. The new value was obtained by measuring the specific β activity with a liquid-scintillation-counter technique and the Si32 concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic Si32.

AB - The half-life of Si32 has been measured to be T12=101±18 yr, considerably shorter than the previously accepted value of 300 yr. The new value was obtained by measuring the specific β activity with a liquid-scintillation-counter technique and the Si32 concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic Si32.

UR - https://www.scopus.com/pages/publications/4243844044

U2 - 10.1103/PhysRevLett.45.592

DO - 10.1103/PhysRevLett.45.592

M3 - Article

AN - SCOPUS:4243844044

SN - 0031-9007

VL - 45

SP - 592

EP - 596

JO - Physical Review Letters

JF - Physical Review Letters

IS - 8

ER -

Measurement of the Si32 half-life via accelerator mass spectrometry

Abstract

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