Magnetization profile at the Fe/GaAs(0 0 1)-4 × 6 interface

L. Giovanelli, C. S. Tian, P. L. Gastelois, G. Panaccione, M. Fabrizioli, M. Hochstrasser, M. Galaktionov, C. H. Back, G. Rossi

Research output: Contribution to journalConference articlepeer-review

11 Scopus citations

Abstract

The magnetization of a thin Fe film epitaxially grown on GaAs(001)-4 × 6 was studied at different depths from the metal/semiconductor interface using a single layer of Fe0.5Co0.5 as a marker layer through a double-wedge Fe film. By measuring the X-ray magnetic circular dichroism spectroscopy at the L2,3 of Co, the magnetic response of the film could be sensed at different distances from the interface. Data show a reduction of the magnetization at the interface though the existence of a magnetically "dead" layer is completely ruled out. Moreover, the magnetization was found to be reduced at the Fe film surface.

Original languageEnglish
Pages (from-to)177-180
Number of pages4
JournalPhysica B: Condensed Matter
Volume345
Issue number1-4
DOIs
StatePublished - 1 Mar 2004
Externally publishedYes
EventProceedings of the Conference on Polarised Neutron - Venice, Italy
Duration: 4 Aug 20036 Aug 2003

Keywords

  • Co
  • Fe
  • GaAs
  • Spin injection
  • X-ray magnetic circular dichroism

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