TY - GEN
T1 - MAGIC
T2 - 17th IEEE International New Circuits and Systems Conference, NEWCAS 2019
AU - Listl, Alexandra
AU - Mueller-Gritschneder, Daniel
AU - Schlichtmann, Ulf
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/6
Y1 - 2019/6
N2 - Many embedded systems such as automotive and industrial Micro-Controller Units (MCUs) use on-chip SRAM as main data memory of the embedded processor. However, SRAMs are increasingly susceptible to reliability threats such as Bias Temperature Instability (BTI) due to the continuous trend of technology shrinking. BTI leads to a significant performance degradation, especially in the Sense Amplifiers (SAs) of SRAMs, where failures are fatal, since the data of a whole column is destroyed. As countermeasure, usually guardbands are added to the design to prevent failures of the embedded system before its end of life. In this paper we present the Mitigation of AGIng Circuitry (MAGIC), a low-cost circuitry to effectively mitigate aging in SAs by wear-leveling. The circuitry consists of an array of XOR gates and a counter. MAGIC modifies the mapping of SRAM banks to physical addresses. Updating the counter value distributes the stress of highly used addresses, e.g., corresponding to program stack data, onto the complete SRAM array. We evaluate the wear-out for on-chip SRAM data memory loads of a typical embedded application. MAGIC mitigates SA degradation up to 50% for three years of aging while introducing minimal area/performance overhead.
AB - Many embedded systems such as automotive and industrial Micro-Controller Units (MCUs) use on-chip SRAM as main data memory of the embedded processor. However, SRAMs are increasingly susceptible to reliability threats such as Bias Temperature Instability (BTI) due to the continuous trend of technology shrinking. BTI leads to a significant performance degradation, especially in the Sense Amplifiers (SAs) of SRAMs, where failures are fatal, since the data of a whole column is destroyed. As countermeasure, usually guardbands are added to the design to prevent failures of the embedded system before its end of life. In this paper we present the Mitigation of AGIng Circuitry (MAGIC), a low-cost circuitry to effectively mitigate aging in SAs by wear-leveling. The circuitry consists of an array of XOR gates and a counter. MAGIC modifies the mapping of SRAM banks to physical addresses. Updating the counter value distributes the stress of highly used addresses, e.g., corresponding to program stack data, onto the complete SRAM array. We evaluate the wear-out for on-chip SRAM data memory loads of a typical embedded application. MAGIC mitigates SA degradation up to 50% for three years of aging while introducing minimal area/performance overhead.
KW - Aging Mitigation
KW - Application-Aware Aging Analysis
KW - SRAM
KW - Sense Amplifier
KW - Wear-Leveling
UR - http://www.scopus.com/inward/record.url?scp=85078880619&partnerID=8YFLogxK
U2 - 10.1109/NEWCAS44328.2019.8961241
DO - 10.1109/NEWCAS44328.2019.8961241
M3 - Conference contribution
AN - SCOPUS:85078880619
T3 - 17th IEEE International New Circuits and Systems Conference, NEWCAS 2019
BT - 17th IEEE International New Circuits and Systems Conference, NEWCAS 2019
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 23 June 2019 through 26 June 2019
ER -