Low temperature scanning electron microscopy study of YBa2Cu3O7-δ multilayer dc SQUID magnetometers

R. Gerber; D. Koelle; R. Gross; R. P. Huebener; F. Ludwig; E. Dantsker; R. Kleiner; John Clarke

doi:10.1063/1.115697

Low temperature scanning electron microscopy study of YBa2Cu3O7-δ multilayer dc SQUID magnetometers

R. Gerber, D. Koelle, R. Gross, R. P. Huebener, F. Ludwig, E. Dantsker, R. Kleiner, John Clarke

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Low temperature scanning electron microscopy (LTSEM) has been used to analyze the superconducting properties of integrated magnetometers involving a dc superconducting quantum interference device. The study yielded spatially resolved information on the critical temperature Tc and critical current density Jc in the upper and lower superconducting layers of the YBa2Cu3O7-δ/SrTiO3/YBa2Cu3O7-δ structure. The Tc of the lower film was depressed by several kelvin, and the Jc of the upper film was lower where it crossed the edge of a lower YBa2Cu3O7-δ film covered with SrTiO3. A gradient in Tc was observed in the lower film near the edge of a via, arising presumably from oxygen diffusion during fabrication.

Original language	English
Pages (from-to)	1555-1557
Number of pages	3
Journal	Applied Physics Letters
Volume	68
Issue number	11
DOIs	https://doi.org/10.1063/1.115697
State	Published - 1996
Externally published	Yes

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title = "Low temperature scanning electron microscopy study of YBa2Cu3O7-δ multilayer dc SQUID magnetometers",

abstract = "Low temperature scanning electron microscopy (LTSEM) has been used to analyze the superconducting properties of integrated magnetometers involving a dc superconducting quantum interference device. The study yielded spatially resolved information on the critical temperature Tc and critical current density Jc in the upper and lower superconducting layers of the YBa2Cu3O7-δ/SrTiO3/YBa2Cu3O7-δ structure. The Tc of the lower film was depressed by several kelvin, and the Jc of the upper film was lower where it crossed the edge of a lower YBa2Cu3O7-δ film covered with SrTiO3. A gradient in Tc was observed in the lower film near the edge of a via, arising presumably from oxygen diffusion during fabrication.",

author = "R. Gerber and D. Koelle and R. Gross and Huebener, {R. P.} and F. Ludwig and E. Dantsker and R. Kleiner and John Clarke",

year = "1996",

doi = "10.1063/1.115697",

language = "English",

volume = "68",

pages = "1555--1557",

journal = "Applied Physics Letters",

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publisher = "American Institute of Physics",

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T1 - Low temperature scanning electron microscopy study of YBa2Cu3O7-δ multilayer dc SQUID magnetometers

AU - Gerber, R.

AU - Koelle, D.

AU - Gross, R.

AU - Huebener, R. P.

AU - Ludwig, F.

AU - Dantsker, E.

AU - Kleiner, R.

AU - Clarke, John

PY - 1996

Y1 - 1996

N2 - Low temperature scanning electron microscopy (LTSEM) has been used to analyze the superconducting properties of integrated magnetometers involving a dc superconducting quantum interference device. The study yielded spatially resolved information on the critical temperature Tc and critical current density Jc in the upper and lower superconducting layers of the YBa2Cu3O7-δ/SrTiO3/YBa2Cu3O7-δ structure. The Tc of the lower film was depressed by several kelvin, and the Jc of the upper film was lower where it crossed the edge of a lower YBa2Cu3O7-δ film covered with SrTiO3. A gradient in Tc was observed in the lower film near the edge of a via, arising presumably from oxygen diffusion during fabrication.

AB - Low temperature scanning electron microscopy (LTSEM) has been used to analyze the superconducting properties of integrated magnetometers involving a dc superconducting quantum interference device. The study yielded spatially resolved information on the critical temperature Tc and critical current density Jc in the upper and lower superconducting layers of the YBa2Cu3O7-δ/SrTiO3/YBa2Cu3O7-δ structure. The Tc of the lower film was depressed by several kelvin, and the Jc of the upper film was lower where it crossed the edge of a lower YBa2Cu3O7-δ film covered with SrTiO3. A gradient in Tc was observed in the lower film near the edge of a via, arising presumably from oxygen diffusion during fabrication.

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DO - 10.1063/1.115697

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SN - 0003-6951

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EP - 1557

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 11

ER -

Low temperature scanning electron microscopy study of YBa2Cu3O7-δ multilayer dc SQUID magnetometers

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