Low temperature scanning electron microscopy study of YBa 2Cu3O7-δ multilayer dc SQUID magnetometers

R. Gerber; D. Koelle; R. Gross; R. P. Huebener; F. Ludwig; E. Dantsker; R. Kleiner; John Clarke

Low temperature scanning electron microscopy study of YBa ₂Cu₃O_7-δ multilayer dc SQUID magnetometers

R. Gerber, D. Koelle, R. Gross, R. P. Huebener, F. Ludwig, E. Dantsker, R. Kleiner, John Clarke

Research output: Contribution to journal › Article › peer-review

Abstract

Low temperature scanning electron microscopy (LTSEM) has been used to analyze the superconducting properties of integrated magnetometers involving a dc superconducting quantum interference device. The study yielded spatially resolved information on the critical temperature T_c and critical current density J_c in the upper and lower superconducting layers of the YBa₂Cu₃O_7-δ/SrTiO₃/ YBa₂Cu₃O_7-δ structure. The T_c of the lower film was depressed by several kelvin, and the J_c of the upper film was lower where it crossed the edge of a lower YBa₂Cu ₃O_7-δ film covered with SrTiO₃. A gradient in T_c was observed in the lower film near the edge of a via, arising presumably from oxygen diffusion during fabrication.

Original language	English
Pages (from-to)	1555
Number of pages	1
Journal	Applied Physics Letters
State	Published - 1995
Externally published	Yes

Cite this

@article{ff566f180b474ab0a65da4ce0d104450,

title = "Low temperature scanning electron microscopy study of YBa 2Cu3O7-δ multilayer dc SQUID magnetometers",

abstract = "Low temperature scanning electron microscopy (LTSEM) has been used to analyze the superconducting properties of integrated magnetometers involving a dc superconducting quantum interference device. The study yielded spatially resolved information on the critical temperature Tc and critical current density Jc in the upper and lower superconducting layers of the YBa2Cu3O7-δ/SrTiO3/ YBa2Cu3O7-δ structure. The Tc of the lower film was depressed by several kelvin, and the Jc of the upper film was lower where it crossed the edge of a lower YBa2Cu 3O7-δ film covered with SrTiO3. A gradient in Tc was observed in the lower film near the edge of a via, arising presumably from oxygen diffusion during fabrication.",

author = "R. Gerber and D. Koelle and R. Gross and Huebener, {R. P.} and F. Ludwig and E. Dantsker and R. Kleiner and John Clarke",

year = "1995",

language = "English",

pages = "1555",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Low temperature scanning electron microscopy study of YBa 2Cu3O7-δ multilayer dc SQUID magnetometers

AU - Gerber, R.

AU - Koelle, D.

AU - Gross, R.

AU - Huebener, R. P.

AU - Ludwig, F.

AU - Dantsker, E.

AU - Kleiner, R.

AU - Clarke, John

PY - 1995

Y1 - 1995

N2 - Low temperature scanning electron microscopy (LTSEM) has been used to analyze the superconducting properties of integrated magnetometers involving a dc superconducting quantum interference device. The study yielded spatially resolved information on the critical temperature Tc and critical current density Jc in the upper and lower superconducting layers of the YBa2Cu3O7-δ/SrTiO3/ YBa2Cu3O7-δ structure. The Tc of the lower film was depressed by several kelvin, and the Jc of the upper film was lower where it crossed the edge of a lower YBa2Cu 3O7-δ film covered with SrTiO3. A gradient in Tc was observed in the lower film near the edge of a via, arising presumably from oxygen diffusion during fabrication.

AB - Low temperature scanning electron microscopy (LTSEM) has been used to analyze the superconducting properties of integrated magnetometers involving a dc superconducting quantum interference device. The study yielded spatially resolved information on the critical temperature Tc and critical current density Jc in the upper and lower superconducting layers of the YBa2Cu3O7-δ/SrTiO3/ YBa2Cu3O7-δ structure. The Tc of the lower film was depressed by several kelvin, and the Jc of the upper film was lower where it crossed the edge of a lower YBa2Cu 3O7-δ film covered with SrTiO3. A gradient in Tc was observed in the lower film near the edge of a via, arising presumably from oxygen diffusion during fabrication.

UR - http://www.scopus.com/inward/record.url?scp=36448998693&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:36448998693

SN - 0003-6951

SP - 1555

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -

Low temperature scanning electron microscopy study of YBa ₂Cu₃O_7-δ multilayer dc SQUID magnetometers

Abstract

Other files and links

Fingerprint

Cite this