Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions

R. Gross; T. Doderer; R. P. Huebener; F. Kober; D. Koelle; C. Kruelle; J. Mannhart; B. Mayer; D. Quenter; A. Ustinov

doi:10.1016/0921-4526(91)90261-C

Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions

R. Gross, T. Doderer, R. P. Huebener, F. Kober, D. Koelle, C. Kruelle, J. Mannhart, B. Mayer, D. Quenter, A. Ustinov

University of Tübingen

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial and temporal resolution is obtained. By Low-Temperature Scanning Electron Microscopy (LTSEM) important new information on low-temperature phenomena in superconductors, semiconductors, and insulators is obtained by two-dimensional imaging. Here, we summarize the basic principles of LTSEM and show its application to the study of superconducting films and Josephson junctions.

Original language	English
Pages (from-to)	415-421
Number of pages	7
Journal	Physica B: Condensed Matter
Volume	169
Issue number	1-4
DOIs	https://doi.org/10.1016/0921-4526(91)90261-C
State	Published - 2 Feb 1991
Externally published	Yes

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title = "Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions",

abstract = "Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial and temporal resolution is obtained. By Low-Temperature Scanning Electron Microscopy (LTSEM) important new information on low-temperature phenomena in superconductors, semiconductors, and insulators is obtained by two-dimensional imaging. Here, we summarize the basic principles of LTSEM and show its application to the study of superconducting films and Josephson junctions.",

author = "R. Gross and T. Doderer and Huebener, {R. P.} and F. Kober and D. Koelle and C. Kruelle and J. Mannhart and B. Mayer and D. Quenter and A. Ustinov",

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doi = "10.1016/0921-4526(91)90261-C",

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T1 - Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions

AU - Gross, R.

AU - Doderer, T.

AU - Huebener, R. P.

AU - Kober, F.

AU - Koelle, D.

AU - Kruelle, C.

AU - Mannhart, J.

AU - Mayer, B.

AU - Quenter, D.

AU - Ustinov, A.

PY - 1991/2/2

Y1 - 1991/2/2

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AB - Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial and temporal resolution is obtained. By Low-Temperature Scanning Electron Microscopy (LTSEM) important new information on low-temperature phenomena in superconductors, semiconductors, and insulators is obtained by two-dimensional imaging. Here, we summarize the basic principles of LTSEM and show its application to the study of superconducting films and Josephson junctions.

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JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 1-4

ER -

Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions

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