Low-temperature scanning electron microscopy for studying inhomogeneities in thin-film high-Tc superconductors

R. P. Huebener; R. Gross; J. Bosch

doi:10.1007/BF01312115

Low-temperature scanning electron microscopy for studying inhomogeneities in thin-film high-T_c superconductors

R. P. Huebener, R. Gross, J. Bosch

University of Tübingen

Research output: Contribution to journal › Article › peer-review

22 Scopus citations

Abstract

Low-temperature scanning electron microscopy can provide important information on the local superconducting properties of thin-iilm high-T_c superconductors. The principle of this method is outlined, including the spatial resolution limit. The spatial variations observation of the local values of the critical temperature and of the critical current density represent highly important applications of this method. The spatial variations of flux pinning and flux flow can be also studied.

Original language	English
Pages (from-to)	425-430
Number of pages	6
Journal	Zeitschrift für Physik B Condensed Matter
Volume	70
Issue number	4
DOIs	https://doi.org/10.1007/BF01312115
State	Published - Dec 1988
Externally published	Yes

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title = "Low-temperature scanning electron microscopy for studying inhomogeneities in thin-film high-Tc superconductors",

abstract = "Low-temperature scanning electron microscopy can provide important information on the local superconducting properties of thin-iilm high-Tc superconductors. The principle of this method is outlined, including the spatial resolution limit. The spatial variations observation of the local values of the critical temperature and of the critical current density represent highly important applications of this method. The spatial variations of flux pinning and flux flow can be also studied.",

author = "Huebener, {R. P.} and R. Gross and J. Bosch",

year = "1988",

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AU - Bosch, J.

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AB - Low-temperature scanning electron microscopy can provide important information on the local superconducting properties of thin-iilm high-Tc superconductors. The principle of this method is outlined, including the spatial resolution limit. The spatial variations observation of the local values of the critical temperature and of the critical current density represent highly important applications of this method. The spatial variations of flux pinning and flux flow can be also studied.

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Low-temperature scanning electron microscopy for studying inhomogeneities in thin-film high-T_c superconductors

Abstract

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