Low frequency voltage noise in high temperature superconductor Josephson junctions

A. Marx; L. Alff; R. Gross

doi:10.1016/S0964-1807(99)00020-4

Low frequency voltage noise in high temperature superconductor Josephson junctions

A. Marx, L. Alff, R. Gross

University of Cologne

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

The origin of 1/f voltage noise in different types of Josephson junctions fabricated from the high temperature superconductors (HTS) have been traced back to the trapping and release of charge carriers in trapping centers in an insulating barrier giving rise to correlated fluctuations of the junction critical current I_c and normal state resistance R_n. For the normalized fluctuations S_I and S_R a linear scaling with R_n has been observed which suggests an almost constant density of trapping centers for all investigated HTS Josephson junctions. Using this linear scaling we have made an approximate calculation of the density of the trapping centers.

Original language	English
Pages (from-to)	621-627
Number of pages	7
Journal	Applied Superconductivity
Volume	6
Issue number	10-12
DOIs	https://doi.org/10.1016/S0964-1807(99)00020-4
State	Published - 1999
Externally published	Yes

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title = "Low frequency voltage noise in high temperature superconductor Josephson junctions",

abstract = "The origin of 1/f voltage noise in different types of Josephson junctions fabricated from the high temperature superconductors (HTS) have been traced back to the trapping and release of charge carriers in trapping centers in an insulating barrier giving rise to correlated fluctuations of the junction critical current Ic and normal state resistance Rn. For the normalized fluctuations SI and SR a linear scaling with Rn has been observed which suggests an almost constant density of trapping centers for all investigated HTS Josephson junctions. Using this linear scaling we have made an approximate calculation of the density of the trapping centers.",

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AU - Alff, L.

AU - Gross, R.

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AB - The origin of 1/f voltage noise in different types of Josephson junctions fabricated from the high temperature superconductors (HTS) have been traced back to the trapping and release of charge carriers in trapping centers in an insulating barrier giving rise to correlated fluctuations of the junction critical current Ic and normal state resistance Rn. For the normalized fluctuations SI and SR a linear scaling with Rn has been observed which suggests an almost constant density of trapping centers for all investigated HTS Josephson junctions. Using this linear scaling we have made an approximate calculation of the density of the trapping centers.

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U2 - 10.1016/S0964-1807(99)00020-4

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JO - Applied Superconductivity

JF - Applied Superconductivity

IS - 10-12

ER -

Low frequency voltage noise in high temperature superconductor Josephson junctions

Abstract

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