Low-frequency noise in deep-submicron mosfets

Gilson Wirth; Jeongwook Koh; Roberto Da Silva; Roland Thewes; Ralf Brederlow

Low-frequency noise in deep-submicron mosfets

Gilson Wirth, Jeongwook Koh, Roberto Da Silva, Roland Thewes, Ralf Brederlow

Research output: Contribution to conference › Paper › peer-review

Abstract

The low-frequency noise (LF-noise) in deep sub-micron MOSFETs is experimentally studied and modeled. A novel modeling approach is presented, including detailed modeling of statistical effects. The physics-related parameters which cause statistical fluctuations in LF-noise performance between devices are detailed. A compact model is developed for implementing these analog-yield-relevant effects in circuit simulation tools.

Original language	English
Pages	15-20
Number of pages	6
State	Published - 2004
Externally published	Yes
Event	Microelectronis Technology and Devices, SBMICRO 2004 - Proceedings of the Nineteenth International Symposium - Porto De Galinhas, Pernambuco, Brazil Duration: 7 Sep 2004 → 11 Sep 2004

Conference

Conference	Microelectronis Technology and Devices, SBMICRO 2004 - Proceedings of the Nineteenth International Symposium
Country/Territory	Brazil
City	Porto De Galinhas, Pernambuco
Period	7/09/04 → 11/09/04

Cite this

@conference{64f300a4779a4f7792cdaee7070397fc,

title = "Low-frequency noise in deep-submicron mosfets",

abstract = "The low-frequency noise (LF-noise) in deep sub-micron MOSFETs is experimentally studied and modeled. A novel modeling approach is presented, including detailed modeling of statistical effects. The physics-related parameters which cause statistical fluctuations in LF-noise performance between devices are detailed. A compact model is developed for implementing these analog-yield-relevant effects in circuit simulation tools.",

author = "Gilson Wirth and Jeongwook Koh and {Da Silva}, Roberto and Roland Thewes and Ralf Brederlow",

year = "2004",

language = "English",

pages = "15--20",

note = "Microelectronis Technology and Devices, SBMICRO 2004 - Proceedings of the Nineteenth International Symposium ; Conference date: 07-09-2004 Through 11-09-2004",

}

TY - CONF

T1 - Low-frequency noise in deep-submicron mosfets

AU - Wirth, Gilson

AU - Koh, Jeongwook

AU - Da Silva, Roberto

AU - Thewes, Roland

AU - Brederlow, Ralf

PY - 2004

Y1 - 2004

N2 - The low-frequency noise (LF-noise) in deep sub-micron MOSFETs is experimentally studied and modeled. A novel modeling approach is presented, including detailed modeling of statistical effects. The physics-related parameters which cause statistical fluctuations in LF-noise performance between devices are detailed. A compact model is developed for implementing these analog-yield-relevant effects in circuit simulation tools.

AB - The low-frequency noise (LF-noise) in deep sub-micron MOSFETs is experimentally studied and modeled. A novel modeling approach is presented, including detailed modeling of statistical effects. The physics-related parameters which cause statistical fluctuations in LF-noise performance between devices are detailed. A compact model is developed for implementing these analog-yield-relevant effects in circuit simulation tools.

UR - http://www.scopus.com/inward/record.url?scp=17044371980&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:17044371980

SP - 15

EP - 20

T2 - Microelectronis Technology and Devices, SBMICRO 2004 - Proceedings of the Nineteenth International Symposium

Y2 - 7 September 2004 through 11 September 2004

ER -

Low-frequency noise in deep-submicron mosfets

Abstract

Conference

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